SN54ACT8997_TI 具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 反相器

SN54ACT8997的基本参数

制造厂商：TI
产品类别：逻辑和电压转换
技术类目：缓冲器、驱动器和收发器 - 反向缓冲器和驱动器
功能描述：具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 反相器
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SN54ACT8997的产品详情：

The 'ACT8997 are members of the Texas Instruments SCOPE^TM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.

The 'ACT8997 enhance the scan capability of TI's SCOPE^TM family by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.

By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any of the device's six data registers or the instruction register can be placed in the device's scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.

All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on either the rising or falling edge of DCI.

The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.

The SN54ACT8997 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ACT8997 is characterized for operation from 0°C to 70°C.

SN54ACT8997的优势和特性：

Members of the Texas Instruments SCOPETM Family of Testability Products
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus
Allow Partitioning of System Scan Paths
Can Be Cascaded Horizontally or Vertically
Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path
Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals
Include 4-Bit Identification Bus for Scan-Path Identification
Inputs Are TTL Compatible
EPICTM (Enhanced-Performance Implanted CMOS) 1-m Process
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs

SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

SN54ACT8997的参数（英文）：

Technology Family
ACT
Supply voltage (Min) (V)
4.5
Supply voltage (Max) (V)
5.5
Number of channels (#)
4
IOL (Max) (mA)
48
IOH (Max) (mA)
-16
ICC (Max) (uA)
100
Input type
TTL-Compatible CMOS
Output type
3-State
Features
High speed (tpd 10-50ns), Input clamp diode
Rating
Military

SN54ACT8997具体的完整产品型号参数及价格（美元）：

SN54ACT8997的完整型号有：5962-9323901Q3A、5962-9323901QXA、SNJ54ACT8997FK、SNJ54ACT8997JT，以下是这些产品的关键参数及官网采购报价：

5962-9323901Q3A，工作温度：-55 to 125，封装：LCCC (FK)-28，包装数量MPQ：1个，MSL 等级/回流焊峰值温度：N/A for Pkg Type，引脚镀层/焊球材料：SNPB，TI官网5962-9323901Q3A的批量USD价格：86.225（1000+）

5962-9323901QXA，工作温度：-55 to 125，封装：CDIP (JT)-28，包装数量MPQ：1个，MSL 等级/回流焊峰值温度：N/A for Pkg Type，引脚镀层/焊球材料：SNPB，TI官网5962-9323901QXA的批量USD价格：80.663（1000+）

SNJ54ACT8997FK，工作温度：-55 to 125，封装：LCCC (FK)-28，包装数量MPQ：1个，MSL 等级/回流焊峰值温度：N/A for Pkg Type，引脚镀层/焊球材料：SNPB，TI官网SNJ54ACT8997FK的批量USD价格：86.225（1000+）

SNJ54ACT8997JT，工作温度：-55 to 125，封装：CDIP (JT)-28，包装数量MPQ：1个，MSL 等级/回流焊峰值温度：N/A for Pkg Type，引脚镀层/焊球材料：SNPB，TI官网SNJ54ACT8997JT的批量USD价格：80.663（1000+）

SN54ACT8997的评估套件：

SN54ACT8997的电路图解：

SN54ACT8997的评估套件：