- 制造厂商：TI
- 产品类别：逻辑和电压转换
- 技术类目：触发器、锁存器和寄存器 - D 型锁存器
- 功能描述：具有三态输出的增强型产品八路 D 类透明锁存器
- 点击这里打开及下载SN74ACT373-EP的技术文档资料
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This 8-bit latch features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
The eight latches are D-type transparent latches. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the logic levels set up at the D inputs.
A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines in bus-organized systems without need for interface or pullup components.
OE\ does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.
To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 4.5-V to 5.5-V VCC Operation
- Inputs Accept Voltages to 5.5 V
- Max tpd of 10 ns at 5 V
- Inputs Are TTL-Voltage Compatible
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
- Number of channels (#)
- 8
- Technology Family
- ACT
- Supply voltage (Min) (V)
- 4.5
- Supply voltage (Max) (V)
- 5.5
- Input type
- TTL-Compatible CMOS
- Output type
- 3-State
- Clock Frequency (Max) (MHz)
- 90
- IOL (Max) (mA)
- 24
- IOH (Max) (mA)
- -24
- ICC (Max) (uA)
- 80
- Features
- Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode
SN74ACT373-EP的完整型号有：SN74ACT373MDWREP、V62/04619-01XE，以下是这些产品的关键参数及官网采购报价：
SN74ACT373MDWREP，工作温度：-55 to 125，封装：SOIC (DW)-20，包装数量MPQ：2000个，MSL 等级/回流焊峰值温度：Level-1-260C-UNLIM，引脚镀层/焊球材料：NIPDAU，TI官网SN74ACT373MDWREP的批量USD价格：1.152（1000+）
V62/04619-01XE，工作温度：-55 to 125，封装：SOIC (DW)-20，包装数量MPQ：2000个，MSL 等级/回流焊峰值温度：Level-1-260C-UNLIM，引脚镀层/焊球材料：NIPDAU，TI官网V62/04619-01XE的批量USD价格：1.152（1000+）
SN74ACT373MDWREP，工作温度：-55 to 125，封装：SOIC (DW)-20，包装数量MPQ：2000个，MSL 等级/回流焊峰值温度：Level-1-260C-UNLIM，引脚镀层/焊球材料：NIPDAU，TI官网SN74ACT373MDWREP的批量USD价格：1.152（1000+）
V62/04619-01XE，工作温度：-55 to 125，封装：SOIC (DW)-20，包装数量MPQ：2000个，MSL 等级/回流焊峰值温度：Level-1-260C-UNLIM，引脚镀层/焊球材料：NIPDAU，TI官网V62/04619-01XE的批量USD价格：1.152（1000+）
